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Features:

• JEOL JSM-6060LV has resolution of 3.5 nm in the high vacuum SEM mode and 4.0nm in the lowvacuum SEM mode.

• The newly developed electron optics has a lowest magnification of 5X.

• The specimen chamber is tall enough for a 50mm high specimen and is equipped with a eucentricspecimen stage.

• The operation graphic user interface (GUI) has automatic functions, recipe (customapplications settings), a simple Desk Top Publisher and a browseable image database forcomfortable operation from observation to report creation.

• The low vacuum SEM mode enables one to observe and analyze non-conductive, wet, or high-vacuum incompatible specimens.

Rigaku MiniFlex II Desktop X-ray Diffractometer

The Rigaku Miniflex II can be used for a variety of applications from diffraction pattern comparison of polycrystalline materials such as powder samples and metal plates to qualitative and quantitative analyses and quality management of raw materials and products. The bench top instrument uses CuKα radiation and is ideal for quick data collections of both powder and thin-film samples ranging from simple oxides to complex compounds.

Measurements:

• Phase identification
• Phase quantification (phase ID)
• Percent (%) crystallinity
• Crystallite size and strain
• Lattice parameter refinement
• Rietveld refinement
• Molecular structure
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Bruker Dimension Edge

Dimension Edge incorporates Bruker's PeakForce Tapping technology to provide the highest levels of atomic force microscope (AFM) performance, functionality, and accessibility in its class. Based on the Dimension Icon platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Integrated visual feedback and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample AFM capabilities and techniques available to every facility and user.

Features:

• Closed-Loop Accuracy
• Large Sample Stage
• Automatic Image Optimization
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AFM Modes:

• Tapping Mode
• Contact Mode
• Conductive AFM (C-AFM)
• Surface Potential Microscopy (SPoM)
• Lateral Force Microscopy
• Magnetic Force Microscopy
• Electric Force Microscopy
• ScanAsyst
• Dark Lift
• Force Spectroscopy
• Nanoindentation,
• Nanolithography
• Adhesion
• PhaseImaging
• LiftMode
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VEECO Dimension 3100

The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen, which provides users the ability to characterize the surface roughness of materials and nanofabricated structures. Sample sizes that can be handled by the instrument range from small pieces to 4-inch diameter wafers.

Scanning Modes:

• Tapping mode
• Contact mode
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LAMBDA 45 UV/Vis System (PerkinElmer)

LAMBDA 45 UV/Vis Spectrophotometer from PerkinElmer can be used for measurements on liquids, solids, pastes, powders samples and regulatory tests requiring variable bandwidths and highly scattering light samples. The additional pre-monochromator reduces stray light by a factor of 2, providing optimum performance for turbid and light-scattering liquid samples, such as biological solutions and suspensions.

Features:

• True double beam operation for very high stability, higher accuracy and reproducibility
• 1 nm resolution and low stray-light design easily passes all pharmacopoeia and regulatory performance tests
• Widest range of reproducible and robust sampling accessories to simplify and speed your analysis, whatever your sample
• Pre-aligned Deuterium and Tungsten-halogen lamps for increased uptime
• Choice of UV WinLab software to simplify analysis from sample entry to report generation